Linked analysis
Scatter
Use dense scatter plots to isolate failing populations, drag limits, and keep wafer and selection context intact across the rest of the analysis loop.
Wafer Sort Product
The current Stratum analysis surface.
Scatter, histogram, CPK, wafer, and spatial views for wafer sort investigation as they exist in the product today, feeding directly into PAT and DPAT screening, exact what-if review, and a saved decision artifact.
Need the product story first? Read why Stratum.
Distribution review
Histogram
Check whether the issue is broad distribution drift or a narrower subset before deciding whether the spec, the population, or the test itself is the real problem.
Screening and review
CPK table
Rank the tests that matter most, generate PAT or DPAT screens, review capability and fail context, and move directly into a controlled proposal.
Spatial diagnosis
Spatial
Spot edge-driven signatures, radial bias, and hotspots quickly enough to decide whether you are looking at process behavior, setup drift, or an isolated outlier.
Wafer overlay
Parametric wafer
Switch from bin view to parametric wafer heat mapping to see whether the lot is drifting systematically before the failures become obvious in pure pass/fail views.